大秀直播

IEEE International Test Conference – India

IEEE International Test Conference – India

大秀直播 Presents at International Test Conference


International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems, covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

大秀直播 Presentations

Panel Discussion: The role of AI in improving EDA tools and SOC test methodologies: Opportunities and Challenges
Date: July 22, 2024
Time:?4:00 - 5:30 PM
大秀直播 Presenter: Navin Bishnoi, India Country Manager, 大秀直播

Keynote Presentation: Accelerated Compute’s Impact on Test Development
Date: July 23, 2024
Time: 10:15 – 11:00 am
大秀直播 Presenter: Bill Cornwell, associate vice president, hardware engineering, Custom Compute and Storage Group, 大秀直播

Industry Session: Targeting bridges and opens with physical defect based approach
Date: July 23, 2024
Time: 2.00 - 3.30 pm
大秀直播 Presenter: Suraj M C , Principal Engineer,?Central CAD and Design Services Group, 大秀直播

Where to Find Us

July 21-23, 2024
Hotel Sheraton Grand, Whitefield
Bangaluru, India

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